Busatto, G.
, Blackburn, D.
and Berning, D.
(1993),
Experimental Study of Reverse-Bias Failure Mechanisms in Bipolar Mode JFET (BMFET), Proc., 24th Annual IEEE Power Electronics Specialists Conference, Seattle, WA, USA (Accessed June 2, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Experimental Study of Reverse-Bias Failure Mechanisms in Bipolar Mode JFET (BMFET)
Published
Author(s)
G. Busatto, ,
Proceedings Title
Proc., 24th Annual IEEE Power Electronics Specialists Conference
Issue
6
Conference Dates
June 20-24, 1993
Conference Location
Seattle, WA, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 30, 1993, Updated October 12, 2021