Knight, S.
and Belzer, B.
(2001),
Office of Microelectronics Programs Technical Accomplishments, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed August 1, 2026)
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Office of Microelectronics Programs Technical Accomplishments
Published
Author(s)
,
Abstract
This document represents the fiscal year 2000 production of the Programs comprising the Office of Microelectronics Programs (OMP).Citation
NIST Interagency/Internal Report (NISTIR) - 6707
Report Number
6707
NIST Pub Series
Pub Type
NIST Pubs
Keywords
semiconductor, microelectronic, metrology, technology, microscopy, materials, reference
Citation
Issues
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Created December 31, 2000, Updated October 12, 2021