Prendergast, J.
and Suehle, J.
(1997),
Inverstigation of the Intrinsic SiO<sub>2</sub> Area Dependence Using TDDB Testing, 1997 IEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA
(Accessed October 13, 2025)
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Inverstigation of the Intrinsic SiO2 Area Dependence Using TDDB Testing
Published
Author(s)
J. Prendergast,
Proceedings Title
1997 IEEE International Integrated Reliability Workshop Final Report
Conference Dates
October 13-16, 1997
Conference Location
Lake Tahoe, CA, USA
Pub Type
Conferences
Citation
Issues
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Created December 30, 1997, Updated October 12, 2021