Review of SI Traceable Force Metrology for Instrumented Indentation and Atomic Force Microscopy

Published

September 23, 2005

Author(s)

David B. Newell, John A. Kramar, Jon R. Pratt, Douglas T. Smith

Abstract

This paper reviews the current status of small force metrology for quantitative instrumented indentation and atomic force microscopy (AFM), and in particular focuses on new electrical and deadweight standards of force developed at the National Institute of Standards and Technology (NIST). These standards provide metrological infrastructure so that users of instrumented indentation and AFM can achieve quantitative nanomechanical testing of materials, engineered surfaces, and micro and nanoscale devices in terms of forces that are expressed in internationally accepted units of measure with quantifiable uncertainty.

Citation

Measurement Science & Technology

Volume

16

Pub Type

Journals

Keywords

AFM force calibration, atomic force microscopy, nanomechanical testing, spring constant calibration

Citation

Newell, D. , Kramar, J. , Pratt, J. and Smith, D. (2005), Review of SI Traceable Force Metrology for Instrumented Indentation and Atomic Force Microscopy, Measurement Science & Technology (Accessed October 11, 2025)