Powell, C.
and Jablonski, A.
(2003),
NIST Databases for Surface Analysis by Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy, Surface and Interface Analysis (Accessed April 27, 2026)
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NIST Databases for Surface Analysis by Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
Published
Author(s)
, Aleksander Jablonski
Abstract
A brief description is given of four databases issued by the National Institute of Standards and Technology (NIST) for applications in surface analysis by Auger-electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS). These databases are: the NIST X-Ray Photoelectron Spectroscopy Database, the NIST Electron Inelastic-Mean-Free-Path Database, and the NIST Electron Effective-Attenuation-Length Database. The purposes and features of these databases are described, and examples are given of data that can be provided.Citation
Surface and Interface Analysis
Pub Type
Journals
Keywords
Auger-electron spectroscopy, cross sections, databases, effective attenuation lengths, elastic scattering, electron, inelastic scattering, surface analysis, x-ray photoelectron spectroscopy
Citation
Issues
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Created February 1, 2003, Updated February 17, 2017