NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Polarization of Light Scattered by Microrough Surfaces and Subsurface Defects
Published
Author(s)
Thomas A. Germer, Clara C. Asmail
Abstract
The polarization of light scattered into directions out of the plane of incidence for 532 nm light incident at 45 with p-polarization was measured from rough silicon, rough titanium nitride, polished fused silica and glass ceramic, and ground and incompletely polished black glass. Models for polarized light scattering from microroughness, subsurface defects, and facets are reviewed. The measurements demonstrate the validity of the models and the utility of polarized light scattering measurements for distinguishing between roughness and defects.
Citation
Journal of the Optical Society of America A-Optics Image Science and Vision
Germer, T.
and Asmail, C.
(1999),
Polarization of Light Scattered by Microrough Surfaces and Subsurface Defects, Journal of the Optical Society of America A-Optics Image Science and Vision
(Accessed October 7, 2025)