NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
NIST Programs for Calibrations in the Far Ultraviolet Spectral Region
Published
Author(s)
Robert E. Vest, L R. Canfield, Mitchell L. Furst, R M. Graves, A D. Hamilton, L R. Hughey, Thomas B. Lucatorto, R P. Madden
Abstract
The National Institute of Standards and Technology (NIST) serves the growing ultraviolet user community by providing calibration services throughout the spectral range from 2 nm to 400 nm. In this paper we describe the far ultraviolet transfer standard detector program, the NASA-supported Spectrometer Calibration Beamline at the Synchrotron Ultraviolet Radiation Facility, SURF III, and the recent upgrade of the SURF electron storage ring. Several types of transfer standard detectors are issued by NIST in the spectral range from 5 nm to 254 nm: Al2O3 windowless photoemissive devices, CsTe photoemissive devices with integrated MgF2 windows, and radiation-hardened, semiconductive Si photodiodes. The Spectrometer Calibration Beamline makes use of the calculable, undispersed synchrotron radiation from SURF III as a standard of spectral irradiance from 2 nm to 400 nm. The upgrade of SURF has greatly improved the accuracy of calibrations based on SURF, as well as extending the useful spectral range to shorter wavelengths. Taken together, the transfer standard detector program and the calibration beamline at SURF III offer a unique calibration resource for scientists and engineers working in the far ultraviolet spectral region.
Proceedings Title
Proceedings of the 44th annual SPIE meeting
Conference Dates
July 22-23, 1999
Conference Title
SPIE Meeting
Pub Type
Conferences
Keywords
calibrations, deep ultraviolet, detector, extreme ultraviolet, far ultraviolet, photodiode, radiometry, synchrotron radiation, transfer standard
Citation
Vest, R.
, Canfield, L.
, Furst, M.
, Graves, R.
, Hamilton, A.
, Hughey, L.
, Lucatorto, T.
and Madden, R.
(1999),
NIST Programs for Calibrations in the Far Ultraviolet Spectral Region, Proceedings of the 44th annual SPIE meeting
(Accessed October 17, 2025)