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PUBLICATIONS

Synthetic Incoherence Via Scanned Gaussian Beams

Published

Author(s)

Zachary H. Levine

Abstract

Tomography, in most formulations, requires an incoherent signal. For a conventional transmission electron microscope, the coherence of the beam often results in diffraction effects which limit the utility of a tilt series with conventional tomographic reconstruction algorithms. In this paper, an analytic solution is given to a scanned Gaussian beam which reduces the beam coherence to be effectively incoherent for medium-size (of order 100 voxels thick) tomographic applications. The scanned Gaussian beam leads to more incoherence than hollow-cone rotating beam illumination.
Citation
Journal of Research (NIST JRES) -
Volume
111 No. 6
NIST Pub Series
Journal of Research (NIST JRES)
Pub Type
NIST Pubs

Keywords

electron microscopy, Gaussian beams, incoherence, synthetic incoherence

Citation

Levine, Z. (2006), Synthetic Incoherence Via Scanned Gaussian Beams, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed October 14, 2025)

Issues

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Created December 1, 2006, Updated February 17, 2017
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