Low Scatter Optical System for Emittance and Temperature Measurements

Published

October 1, 2002

Author(s)

Sergey Mekhontsev, Leonard M. Hanssen

Abstract

The development and evaluation of an optical system for a new spectral directional emittance facility at NIST is reported. The imaging quality and signal contributions due to out-of-field-of-view scattering, commonly characterizedby the size-of-source effect (SSE) parameter, have been measured across the spectral range of 0.65 m to 4 m by three independent methods. The SSE measurement results of scatter levels not exceeding 2-3 parts in 10⁴ are consistent and exceed the design targets. The potential application of the optical system to construction of a portable instrument with low scatter/emission and an operating spectral range of 0.65 m to 20 m are discussed.

Proceedings Title

Temperature, International Symposium | 8th | Temperature: Its Measurement and Control in Science and Industry | AIP

Volume

684

Conference Dates

October 21-24, 2002

Conference Title

AIP Conference Proceedings

Pub Type

Conferences

Keywords

emittance, mirror, optical system, pyrometry, radiometer, reflectance, scattering

Citation

Mekhontsev, S. and Hanssen, L. (2002), Low Scatter Optical System for Emittance and Temperature Measurements, Temperature, International Symposium | 8th | Temperature: Its Measurement and Control in Science and Industry | AIP (Accessed October 27, 2025)