X-Ray Spectroscopy and Calibrations in the 50 eV to 60 keV Range

Published

July 11, 2002

Author(s)

J Seely, Lawrence T. Hudson, J. Weaver, G Holland, C N. Boyer

Abstract

Spectrometers have been developed to record x-ray spectra in the energy range 50 eV to 60 keV. The dispersion elements are transmission crystals for energies higher than approximately 10 keV, reflection crystals for 1 keV to 20 keV and transmission gratings for energies less than 1 keV. The two-dimensional spectral images are recorded on a CCD or CMOS sensor with a phosphor conversion screen. Silcon phodiodes are positioned in front of the 2D sensor to provide absolute x-ray flux calibrations. The diodes have I mm² area and sub-nanosecond time response. The diodes transmission gratings, and attenuation filters were absolutely calibrated using synchrotron radiation. In addition, the diodes were calibrated in pulsed mode using the soft x-ray (70 eV to 250 eV) pulses from individual electron bunches circulating in the synchrotron storage ring, and a self-calibration model extends the calibration to higher energy. X-ray and extreme ultraviolet spectra were recorded at the OMEGA and NIKE laser facilities. A hard x-ray spectrometer in being built for the National Ignition Facility (NIF) that covers the 1 keV to 20 keV range with one transmission crystal channel and four reflection crystal channels.

Proceedings Title

Proceedings of the SPIE conference on Penetrating Radiation Systems and Applications IV

Conference Dates

July 10-11, 2002

Conference Location

Undefined

Conference Title

SPIE Meeting

Pub Type

Conferences

Keywords

curved crystal spectrometer, X-ray spectroscopy

Citation

Seely, J. , Hudson, L. , Weaver, J. , Holland, G. and Boyer, C. (2002), X-Ray Spectroscopy and Calibrations in the 50 eV to 60 keV Range, Proceedings of the SPIE conference on Penetrating Radiation Systems and Applications IV, Undefined (Accessed April 25, 2024)