Black, D.
(2005),
Using X-Ray Topography to Inspect Surfaces of Single-Crystal Components, International Journal of Applied Ceramic Technology (Accessed May 8, 2026)
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Using X-Ray Topography to Inspect Surfaces of Single-Crystal Components
Published
Author(s)
Abstract
X-ray diffraction topography, which is sensitive to local strain and/or crystallographic orientation, provides a unique view of the surface of single-crystal samples and can be used to nondestructively inspect for surface and subsurface damage. The attributes of x-ray topography as applied to inspection will be described and illustrated with examples from recent experiments.Citation
International Journal of Applied Ceramic Technology
Volume
2
Issue
No. 4
Pub Type
Journals
Keywords
damage, defects, surface structure, x-ray diffraction, x-ray topography
Citation
Issues
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Created July 1, 2005, Updated February 17, 2017