Wong-Ng, W.
, Levin, I.
, Vaudin, M.
, Feenstra, R.
, Cook, L.
and Cline, J.
(2003),
High-Temperature X-Ray Diffraction Study of Phase Evolution in Ba<sub>2</sub>YCu<sub>3</sub>O<sub>6+x</sub> Films Using the BaF<sub>2</sub> Conversion Process, Advances In X-Ray Analysis
(Accessed October 12, 2025)
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High-Temperature X-Ray Diffraction Study of Phase Evolution in Ba2YCu3O6+x Films Using the BaF2 Conversion Process
Published
Author(s)
, , , Ron Feenstra, ,
Abstract
In-situ high-temperature x-ray diffraction (HTXRD) was used to study the phase formation and reaction kinetics of the Ba2Ycu3O6+x (Y-213) phase using the ex-situ BaF2 conversion process. Three sets of films on single crystal SrTiO3 substrates were prepared using e-beam co-evaporation technique of BaF2, Y and Cu targets. HTXRD studies were conducted on precursor films with thickness of 0.3 m and 1.0 m. The 0.3 m films showed mainly (00l) texture whereas the 1.0 m films showed a significant volume fraction of (h00) texture as well. A semi-quantitative estimate of the texture fraction was accomplished using the software TexturePlus. The growth of Y-213 and the consumption of BaF2 were found to beapproximately linear in time.Citation
Advances In X-Ray Analysis
Pub Type
Journals
Keywords
Ba<sub>2</sub>YCu<sub>3</sub>O <sub>6+x</sub> films, BaF<sub>2</sub> process, coated conductors, high-temperature x-ray diffraction, phase formation, texture
Citation
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Created August 1, 2003, Updated January 31, 2018