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PUBLICATIONS

Distributed Testing of a Device-Level Interface Specification for a Metrology System

Published

Author(s)

Joseph Falco, John A. Horst, Hui-Min Huang, Thomas Kramer, Frederick M. Proctor, Keith A. Stouffer, Albert J. Wavering

Abstract

A test suite for an key interface within a dimensional measuring system (coordinate measuring machine or CMM) is presented. The test suite consists of test procedures, test definitions, and various testing utilities. A real-time, distributed test utilizing the test suite has been performed and is described.
Citation
NIST Interagency/Internal Report (NISTIR) - 6851
Report Number
6851
NIST Pub Series
NIST Interagency/Internal Report (NISTIR)
Pub Type
NIST Pubs

Download Paper

https://doi.org/10.6028/NIST.IR.6851
Local Download

Keywords

conformance test, coordinate measuring machine, distributed testing, interface specifications, metrology, object-oriented, real-time systems, test suite, validation test

Citation

Falco, J. , Horst, J. , Huang, H. , Kramer, T. , Proctor, F. , Stouffer, K. and Wavering, A. (2002), Distributed Testing of a Device-Level Interface Specification for a Metrology System, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.6851, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=821682 (Accessed October 2, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 30, 2002, Updated October 12, 2021
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