NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Mass Spectrometric and Optical Emission Diagnostics for RF Plasma Reactors

Published

Author(s)

James K. Olthoff, J R. Roberts, R J. Van brunt, James Whetstone, M A. Sobolewski, S Djurovi{cacute}
Proceedings Title
Technical Symposium on Microelectronic Processing Integration
Conference Dates
September 9-13, 1991
Conference Location
San Jose, CA, USA
Conference Title
SPIE Technical Symposium on Microelectronic Processing Integration
Pub Type
Conferences

Citation

Olthoff, J. , Roberts, J. , Van brunt, R. , Whetstone, J. , Sobolewski, M. and Djurovi{cacute}, S. (1991), Mass Spectrometric and Optical Emission Diagnostics for RF Plasma Reactors, Technical Symposium on Microelectronic Processing Integration , San Jose, CA, USA (Accessed November 4, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 31, 1990, Updated October 12, 2021
Was this page helpful?