Francis, M.
, Guerrieri, J.
, MacReynolds, K.
and Wittmann, R.
(2004),
Estimating Multiple-Reflection Uncertainties in Spherical Near-Field Measurements, Proc., Antenna Meas. Tech. Asoc. Symp., Atlanta, GA, USA
(Accessed May 18, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Estimating Multiple-Reflection Uncertainties in Spherical Near-Field Measurements
Published
Author(s)
, , ,
Abstract
We propose a method to estimate multiple-reflection effects on test-antenna pattern and gain uncertainties in the far field derived from spherical near-field measurements. To estimate these uncertainties we make a near-field measurements on two spheres separated by λ/4. We compare this estimate to that obtained when we select several cuts (using all values of θ but only a few values of φ) from each sphere.Proceedings Title
Proc., Antenna Meas. Tech. Asoc. Symp.
Conference Dates
October 18-21, 2004
Conference Location
Atlanta, GA, USA
Pub Type
Conferences
Keywords
near-field measurements, spherical scanning, uncertainty.
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 16, 2004, Updated October 12, 2021