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PUBLICATIONS

Comparison of Microwave and Mutual Inductance Measurements of the Inductive Nonlinearity of HTS Thin Films

Published

Author(s)

John H. Claassen, James Booth, James A. Beall, Leila R. Vale, David A. Rudman, Ronald H. Ono
Citation
Superconductor Science and Technology
Volume
2
Pub Type
Journals
Electrical / electromagnetic metrology

Citation

Claassen, J. , Booth, J. , Beall, J. , Vale, L. , Rudman, D. and Ono, R. (1999), Comparison of Microwave and Mutual Inductance Measurements of the Inductive Nonlinearity of HTS Thin Films, Superconductor Science and Technology (Accessed October 10, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created September 30, 1999, Updated October 12, 2021
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