Measurement of the Loss Tangent of a Thin Polymeric Film Using the Atomic Force Microscope

Published

January 1, 2004

Author(s)

P M. McGuiggan, D J. Yarusso

Abstract

An atomic force microscope (AFM) was used to measure the tan delta of a pressure sensitive adhesive transfer tape as a function of frequency (0.01 Hz to 100 Hz). For the measurement, the sample was oscillated normal to the surface and the response of the cantilever resting on the polymer surface (as measured via the photodiode) was monitored. Both oscillation amplitude and phase were recorded as a function of frequency. The AFM measurement gave the same frequency dependence of tan delta as that measured by a dynamic shear rheometer on a film twenty times thicker. The results demonstrate that the AFM technique can quantitatively measure rheological properties of soft thin polymeric films.

Citation

Journal of Rheology

Volume

19(1)

Pub Type

Journals

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Keywords

AFM, atomic force microscope, loss tangent, polymer rheology, pressure sensitive adhesive, tan delta

Citation

McGuiggan, P. and Yarusso, D. (2004), Measurement of the Loss Tangent of a Thin Polymeric Film Using the Atomic Force Microscope, Journal of Rheology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852080 (Accessed October 15, 2025)