Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Round Robin Study of Arsenic Implant Dose Measurement in Silicon by SIMS

Published

Author(s)

David S. Simons, Richard M. Lindstrom
Citation
Applied Surface Science
Volume
252
Issue
19

Keywords

aresenic, INAA, LEXES, matrix normalization, SIMS

Citation

Simons, D. and Lindstrom, R. (2006), Round Robin Study of Arsenic Implant Dose Measurement in Silicon by SIMS, Applied Surface Science (Accessed October 13, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created July 30, 2006, Updated February 19, 2017
Was this page helpful?