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The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic
Published
Author(s)
S. Avramov, Andrew D. Koffman, Nile M. Oldham, Bryan C. Waltrip
Abstract
A joint effort between the U.S. Naval Academy and the National Institute of Standard and Technology (NIST) resulted in the development of a method to characterize the capacitance and dissipation factor of a set of commercial standard four terminal-pair (4TP) capacitors. The method depends on network analyzer impedance measurements at high frequencies (40 MH-200 MHz) and a regression of these measurements down to the frequency range of 10 MHz-1 kHz. This paper provides an analysis of the sensivitivity of the refression parameters and the high-frequency impedance measurements.
Citation
IEEE Transactions on Instrumentation and Measurement
Avramov, S.
, Koffman, A.
, Oldham, N.
and Waltrip, B.
(2000),
The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=16695
(Accessed October 20, 2025)