Grosvenor, C.
, Johnk, R.
, Novotny, D.
, Canales, S.
, Baker-Jarvis, J.
, Janezic, M.
, Drewniak, J.
, Kolednitseva, M.
, Zhang, J.
and Rawa, P.
(2004),
Electrical material property measurements using a free-field, ultra-wideband system, 2004 IEEE Conference on Electrical Insulation and Dielectric Phenomena, Boulder, CO
(Accessed October 15, 2025)
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Electrical material property measurements using a free-field, ultra-wideband system
Published
Author(s)
, , , , , , Jim L. Drewniak, Marina Kolednitseva, Jianmin Zhang, Poornachander Rawa
Abstract
Abstract: Nondestructive measurements of materials using TEM horn antennas and an ultra-wideband measurement system are presented. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material under test.Proceedings Title
2004 IEEE Conference on Electrical Insulation and Dielectric Phenomena
Conference Dates
October 17-20, 2004
Conference Location
Boulder, CO
Pub Type
Conferences
Keywords
dielectric measurements, genetic algorithms, TEM horn antennas, Time-domain, ultra-wideband system
Citation
Issues
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Created October 1, 2004, Updated February 19, 2017