da Silva, F.
, Pappas, D.
and Wang, C.
(2003),
Magnetic Thin Film Interlaboratory Comparison, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed October 14, 2025)
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Magnetic Thin Film Interlaboratory Comparison
Published
Author(s)
Fabio C. da Silva, , C. M. Wang
Abstract
A potential low magnetic moment standard reference material (SRM) was studied in an interlaboratory comparison. The mean and the standard deviation of the saturation moment ms, the remanent moment mr, and the intrinsic coercivity Hc of nine samples were extracted from hysteresis-loop measurements. Samples were measured by thirteen laboratories using inductive-field loopers, vibrating sample magnetometers, alternating-gradient force magnetometers, and superconducting quantum-interference-device magnetometers. NiFe films on Si substrates had saturation moment measurements reproduced within 5 % variation among the laboratories. The results showCitation
Journal of Research (NIST JRES) -
Volume
108
Issue
2
NIST Pub Series
Pub Type
NIST Pubs
Keywords
interlaboratory comparison, magnetic films, standard reference material
Citation
Issues
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Created February 28, 2003, Updated October 12, 2021