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PUBLICATIONS

LRM Probe-Tip Calibrations with Imperfect Resistors and Lossy Lines

Published

Author(s)

Dylan F. Williams, Roger Marks

Abstract

The line-reflect-match calibration is extended, without significant loss of measurement accuracy, to accommodate imperfect match standards and lossy lines typical of monolithic microwave integrated circuits. We characterize the match and line standards using an additional line standard of moderate length. The new method provides a practical means of obtaining accurate, wideband calibrations with compact standard sets.
Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Volume
24
Conference Dates
December 2-3, 1993
Conference Location
San Jose, CA
Pub Type
Conferences

Download Paper

https://doi.org/10.1109/ARFTG.1993.327038
Electromagnetics

Citation

Williams, D. and Marks, R. (1993), LRM Probe-Tip Calibrations with Imperfect Resistors and Lossy Lines, Tech Dig., Auto. RF Tech. Group Conf., San Jose, CA, [online], https://doi.org/10.1109/ARFTG.1993.327038 (Accessed October 20, 2025)

Issues

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Created December 1, 1993, Updated November 10, 2018
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