Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Method of Measuring Shunt Resistance of Photodiodes

Published

Author(s)

P R. Thompson, Thomas C. Larason

Abstract

A method of measuring the shunt resistance of diodes, specifically photodiodes, is examined and the procedure of how the method is implemented using LabVIEW is detailed. Rudimentary comparison with other accepted methods in industry is done. The uncertainty analysis of the measurements using the specified method is given .
Proceedings Title
2001 Measurement Science Conference
Volume
CD-ROM
Conference Dates
January 18-19, 2001
Conference Location
Undefined
Conference Title
Measurement Science Conference

Keywords

diode, measurement, photodiode, shunt resistance, uncertainty

Citation

Thompson, P. and Larason, T. (2001), Method of Measuring Shunt Resistance of Photodiodes, 2001 Measurement Science Conference, Undefined, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=841525 (Accessed October 11, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 31, 2000, Updated October 12, 2021
Was this page helpful?