NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Tech Note 1458|NIST Measurement Service for DC Standard Resistors

Published

Author(s)

Randolph Elmquist, Dean G. Jarrett, George R. Jones Jr., Marlin E. Kraft, Scott H. Shields, Ronald F. Dziuba

Abstract

At the National Institute of Standards and Technology (NIST), the U.S. representation of the ohm is based on the quantum Hall effect, and it is maintained and disseminated at various resistance levels by working reference groups of standards. This document describes the measurement systems and procedures used to calibrate standard resistors and current shunts of nominal decade values in the resistance range from 10E-5 Ω to 10E12 Ω. Resistance scaling techniques used to assign values to the working standards are discussed. Also included is an assessment of the calibration uncertainties at each resistance level.
Citation
Technical Note (NIST TN) - 1458
Report Number
1458
NIST Pub Series
Technical Note (NIST TN)
Pub Type
NIST Pubs

Download Paper

Local Download

Keywords

Calibration, Electrical resistance, Quantum Hall effect, Resistance bridge, Resistance ratio, Uncertainty

Citation

Elmquist, R. , Jarrett, D. , Jones Jr., G. , Kraft, M. , Shields, S. and Dziuba, R. (2004), Tech Note 1458|NIST Measurement Service for DC Standard Resistors, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31431 (Accessed October 18, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created March 7, 2004, Updated October 12, 2021
Was this page helpful?