Wang, C.
, Yu, L.
, Campbell, J.
, Cheung, K.
, Xuan, Y.
, Ye, P.
, Suehle, J.
and Zhang, D.
(2009),
An Improved Fast I<sub> d </sub>-V ^d g Measurement Technology With Expanded Application Range, 2009 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP
, Reno, NV, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904155
(Accessed October 2, 2025)
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An Improved Fast I d -V ^d g Measurement Technology With Expanded Application Range
Published
Author(s)
, , , , Yi Xuan, Peide Ye, , David Zhang
Abstract
Fast Id-Vg measurements on very high performance devices (very low channel ON-resistance) and larger area devices (therefore large gate capacitance) are subject to serious distortions. Methods to minimize these distortions are introduced in this paper; thus expanding the applicable range of this important measurement technique.Proceedings Title
2009 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP
Conference Dates
October 19-23, 2009
Conference Location
Reno, NV
Pub Type
Conferences
Download Paper
Keywords
Fast Id-Vg, transient charge trapping, displacement current, power droop
Citation
Issues
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Created October 19, 2009, Updated February 19, 2017