TY  - CONF
AU  - Chen Wang
AU  - Liangchun Yu
AU  - Jason Campbell
AU  - Kin Cheung
AU  - Yi Xuan
AU  - Peide Ye
AU  - John Suehle
AU  - David Zhang
C2  - 2009 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP
, Reno, NV
DA  - 2009-10-19
LA  - en
PB  - 2009 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP
, Reno, NV
PY  - 2009
TI  - An Improved Fast I<sub> d </sub>-V ^d g Measurement Technology With Expanded Application Range
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904155
ER  -