Structural Effects in the Growth of Giant Magneto Resistance (GMR) Spin Valves

Published

August 1, 2001

Author(s)

M. Menyhard, G. Zsolt, P. J. Chen, Cedric J. Powell, Robert D. McMichael, William F. Egelhoff Jr.

Abstract

An investigation has been made of the thin-film structure and interface morphology of giant magnetoresistance (GMR) spin valves of the cobalt/copper/cobalt (Co/Cu/Co) type that were grown on polycrystalline NiO substrates at three different temperatures (150, 300 and 450 K). Sputter-depth-profile analyses indicate that the quality of the layering in the Co/Cu/Co structure was only slightly better for the 150 K sample than for the 300 K sample. For the 450 K sample, however, the Co/Cu/Co structure showed extensive disruption. The similarity in the depth-profiles for the 150 and 300 K samples indicates the sensitivity of the GMR to subtle structural differences.

Citation

Applied Surface Science

Volume

180

Issue

3-4

Pub Type

Journals

Keywords

Giant magnetoresistance, Auger depth-profiling, Growth, Metal metal magnetic thin-film structure, Interface morphology

Citation

Menyhard, M. , Zsolt, G. , Chen, P. , Powell, C. , McMichael, R. and Egelhoff, W. (2001), Structural Effects in the Growth of Giant Magneto Resistance (GMR) Spin Valves, Applied Surface Science (Accessed October 11, 2025)