A short description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for X-Ray Photoelectron Spectroscopy (XPS). NIST currently has three databases available: an XPS Database (SRD 20), an Elastic-Electron-Scattering Cross-Section Database (SRD 64), and an Electron Inelastic-Mean-Free-Path Database (SRD 71). NIST also offers Standard Test Data for XPS, a set of simulated XPS data designed to evaluate algorithms and procedures for detecting, locating, and measuring the intensities of overlapping peaks in a doublet; these spectra are available over the internet.
Citation: Surface and Interface Analysis
Pub Type: Journals
databases, reference data, standard test data, surface analysis, x-ray photoelectron spectroscopy