An Evaluation of Automated Latent Fingerprint Identification Technology (Phase II)

Published

April 2, 2009

Author(s)

Michael D. Indovina, Vladimir N. Dvornychenko, Elham Tabassi, George W. Quinn, Patrick J. Grother, Stephen Meagher, Michael D. Garris

Abstract

The National Institute of Standards and Technology (NIST), with the cooperation of eight technology providers, performed a test of accuracy for searching latent fingerprints when using automatically extracted features and matching (AFEM). This test is Phase II of the Evaluation of Latent Fingerprint Technology (ELFT) project. The test was open to both the commercial and academic community, and participants included vendors of Automated Fingerprint Identification Systems (AFIS). This report provides the design, process, assumptions, limitations, results, observations and conclusions of the test.

Citation

NIST Interagency/Internal Report (NISTIR) - 7577

Report Number

7577

NIST Pub Series

NIST Interagency/Internal Report (NISTIR)

Pub Type

NIST Pubs

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Keywords

fingerprints, latent fingerprint, fingerprint matchers, automated matchers, lights-out, ELFT, Phase II, matcher performance

Citation

Indovina, M. , Dvornychenko, V. , Tabassi, E. , Quinn, G. , Grother, P. , Meagher, S. and Garris, M. (2009), An Evaluation of Automated Latent Fingerprint Identification Technology (Phase II), NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=901870 (Accessed October 13, 2025)