This paper describes concepts and measurement techniques necessary for characterization of graphene in the development of graphene-based quantized Hall effect (QHE) devices and resistance standards. We briefly contrast the properties of graphene produced by three common processing methods and discuss the conditions necessary for well-developed resistance plateaus to be observed. Methods used to determine the graphene layer thickness are presented. These metrologically relevant characteristics of graphene are correlated with electrical transport measurements in strong magnetic fields.
Proceedings Title: CPEM 2012 Conference Digest
Conference Dates: July 2-6, 2012
Conference Location: Washington, DC
Conference Title: Conference on Precision Electromagnetic Measurements 2012
Pub Type: Conferences
Electrical resistance measurements, graphene, material properties, measurement standards, quantum Hall effect