Shin, N.
, DeLongchamp, D.
, Kang, J.
, Kline, R.
, Richter, L.
, Prabhu, V.
, Purushothamanc, B.
, Anthony, J.
and Yoon, D.
(2012),
Vertically Segregated Structure and Properties of small molecule-polymer blend semiconductors for organic thin film transistors, Journal of the American Chemical Society, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=906842
(Accessed October 10, 2025)
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Vertically Segregated Structure and Properties of small molecule-polymer blend semiconductors for organic thin film transistors
Published
Author(s)
Nayool Shin, , Jihoon Kang, , , , Balaji Purushothamanc, John E. Anthony, Do Y. Yoon
Abstract
The phase-segregated structure and the electrical properties of thin film blends of the small-molecule semiconductor fluorinated 5,11-bis(triethylsilylethynyl) anthradithiophene with insulating binder polymers were studied for organic thin film transistor applications. Three binders were evaluated: amorphous atactic poly(α-methylstyrene), poly(methylmethacrylate) and semicrystalline syndiotactic polystyrene. The binder polymers induce significant differences in miscibility, segregation behavior and the resultant device performance, which can be explained in terms of different polarities or solidification rates. The vertical stratification and molecular orientations of the blend films were characterized by complementary techniques including grazing incidence X-ray diffraction, neutron reflectivity, variable angle spectroscopic ellipsometry and near edge X-ray absorption fine structure spectroscopy. The segregated film structure, crystalline order and molecular orientation explain significant differences in the electrical performance of these blend films in solution-processed, bottom-gate, bottom-contact transistors.Citation
Journal of the American Chemical Society
Pub Type
Journals
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Keywords
organic electronics, neutron reflectivity, spectroscopic ellipsometry, organic transistor, polymer
Citation
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Created August 26, 2012, Updated October 12, 2021