Effects of Nonlinear Diode Junction Capacitance on the Nose-to-Nose Calibration

Published

May 1, 2001

Author(s)

Kate Remley, Dylan Williams, Donald C. DeGroot, Jan Verspecht, John Kerley

Abstract

We examine the effects of nonlinear diode junction capacitance on the fundamental premise of the noise-to-nose calibration, that the kickout is identical in shape to the impulse response of the sampler. We offer a physical explanation for the error introduced by the nonlinear junction capacitance in terms of small-signal diode equations.

Citation

IEEE Microwave and Wireless Components Letters

Volume

11

Issue

5

Pub Type

Journals

Download Paper

https://doi.org/10.1109/7260.923026

Local Download

Keywords

digital sampling, nose-to-nose calibration, oscilloscope, phase error samplers

Citation

Remley, K. , Williams, D. , DeGroot, D. , Verspecht, J. and Kerley, J. (2001), Effects of Nonlinear Diode Junction Capacitance on the Nose-to-Nose Calibration, IEEE Microwave and Wireless Components Letters, [online], https://doi.org/10.1109/7260.923026, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=16082 (Accessed October 18, 2025)