Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Combinatorial Test Generation for Software Product Lines Using Minimum Invalid Tuples

Published

Author(s)

Yu Lei, Raghu N. Kacker

Abstract

A software product line is a set of software systems that share some common features. Several recent works have been reported that apply combinatorial testing, a very effective testing strategy to software product lines. A unique challenge in these works is dealing with a potentially large number of constraints among different features. In this paper, we propose a novel constraint handling strategy that uses minimum invalid tuples (MITs) as an alternative of traditional constraint solver. Our approach systematically derives all MITs from a software product line, and uses them to quickly determine the validity of a test configuration during test generation. We report a test generation tool called LOOKUP that integrates the proposed constraint handling strategy with a general test generation algorithm called IPOG-C. Experimental results show that LOOKUP performs considerably better than two existing test generation tools in terms of test size and execution time.
Proceedings Title
15th IEEE International Symposium on High Assurance Systems Engineering (HASE 2014)
Conference Dates
January 9-11, 2014
Conference Location
Miami, FL, US
Conference Title
15th IEEE International Symposium on High Assurance Systems Engineering (HASE 2014)

Keywords

Combinatorial Testing, Constraints, covering Arrays Feature Model

Citation

Lei, Y. and Kacker, R. (2014), Combinatorial Test Generation for Software Product Lines Using Minimum Invalid Tuples, 15th IEEE International Symposium on High Assurance Systems Engineering (HASE 2014) , Miami, FL, US, [online], https://doi.org/10.1109/HASE.2014.18, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914788 (Accessed October 1, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 8, 2014, Updated October 12, 2021
Was this page helpful?