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Use of Single Particle Inductively Coupled Plasma Mass Spectrometry to Characterize a New Silver Nanoparticle Reference Material
Published
Author(s)
Karen E. Murphy, Jingyu Liu, William F. Guthrie, Justin M. Gorham, John E. Bonevich, Andrew J. Allen, Michael R. Winchester, Vincent A. Hackley, Robert MacCuspie
Abstract
In this study we use inductively coupled plasma mass spectrometry operated in single particle mode (spICP-MS) to simultaneously characterize the size distribution and dissolved silver fraction of a new silver nanoparticle (AgNP) candidate reference material, RM 8017, composed of polyvinylpyrrolidone (PVP)-stabilized 75 nm AgNPs (nominal size). We show the potential for bias in spICP-MS measurement of AgNPs if the time lapse between preparation of the dilute suspension in water and measurement is not minimized. We demonstrate that the particle size distributions measured by spICP-MS compare well with transmission electron microscopy (TEM), atomic force microscopy (AFM), and ultra-small angle X-ray scattering (USAXS) measurements. Finally, data on the stability of reconstituted RM 8017 stored at 4 °C shows minimal degradation of the AgNPs over the period of 90 days. This study shows the potential of spICP-MS as a tool to characterize the basic parameters of nanoparticle suspensions including size, size distribution, particle number concentration, and ionic content.
Proceedings Title
Nanotech Conference Technical Proceedings
Conference Dates
June 15-18, 2014
Conference Location
Washington, D.C. , DC
Pub Type
Conferences
Keywords
single particle ICP-MS, reference material, nanomaterial characterization, silver nanoparticles
Murphy, K.
, Liu, J.
, Guthrie, W.
, Gorham, J.
, Bonevich, J.
, Allen, A.
, Winchester, M.
, Hackley, V.
and MacCuspie, R.
(2014),
Use of Single Particle Inductively Coupled Plasma Mass Spectrometry to Characterize a New Silver Nanoparticle Reference Material, Nanotech Conference Technical Proceedings, Washington, D.C. , DC
(Accessed October 7, 2025)