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PUBLICATIONS

Accurate High-Ohmic Resistance Measurement Techniques up to 1 Pohm

Published

Author(s)

Dean G. Jarrett, Gert Rietveld, Beat Jeckelmann

Abstract

An overview is presented on precision high-ohmic resistance measurements for values of 100 Mohmand above. The two main measurement techniques in this resistance range are discussed, the current integration technique and the adapted Wheatstone bridge. The quality of high-ohmic resistance standards, especially their time constants, temperature and voltage dependence, often is limiting the final uncertainty that can be reached. Still, expanded uncertainties (k = 2) of only a few parts in 10^5 are achievable at the 1 Tohm level.
Proceedings Title
CPEM 2014 Conference Digest
Conference Dates
August 24-29, 2014
Conference Location
Rio de Janeiro
Conference Title
Conference on Precision Electromagnetic Measurements (CPEM) 2014
Pub Type
Conferences

Keywords

Resistance, resistance measurements, high-ohmic, adapted Wheatstone bridge, teraohmmeter, resistance scaling, precision measurement
Standards

Citation

Jarrett, D. , Rietveld, G. and Jeckelmann, B. (2014), Accurate High-Ohmic Resistance Measurement Techniques up to 1 Pohm, CPEM 2014 Conference Digest, Rio de Janeiro, -1 (Accessed October 1, 2025)

Issues

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Created August 24, 2014, Updated February 19, 2017
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