Kaplan, S.
, Hanssen, L.
, Migdall, A.
and Lefever-Button, G.
(1998),
Characterization of High-OD Ultrathin Infrared Neutral Density Filters, SPIE series, [online], https://doi.org/10.1117/12.326679 (Accessed May 16, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Characterization of High-OD Ultrathin Infrared Neutral Density Filters
Published
Author(s)
, , , G Lefever-Button
Abstract
We have performed transmittance measurements of metal-film neutral density filters on ultrathin polymer substrates using both Fourier-transform infrared spectrometer and laser-based (3.39 mm and 10.6 mm) systems. The use of ultrathin substrates, free of etaloning effects over the 2 mm to 20 mm spectral range, allows the FT-IR and laser measurements to be directly compared. We discuss the evaluation of the uncertainties in the transmittance values in both types of systems.Citation
SPIE series
Pub Type
Journals
Download Paper
Keywords
infrared, neutral-density filter, transmittance
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created October 8, 1998, Updated November 10, 2018