Vest, R.
(2011),
EUV metrology at NIST SURF III for lithography, astronomy, solar physics, and particle detection applications, 262nd PTB Seminar: EUV Metrology, [online], http://www.euv2011.ptb.de/euv2011/euv-home.html
(Accessed October 8, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
EUV metrology at NIST SURF III for lithography, astronomy, solar physics, and particle detection applications
Published
Author(s)
Abstract
The National Institute of Standards and Technology (NIST) operates the Synchrotron Ultraviolet Radiation Facility (SURF III) to support a number of applications of extreme ultraviolet radiation. SURF III is a 400 MeV electron storage ring that can operate in a number of special modes optimized for radiometry and metrology. In this talk, I will describe the synchrotron radiation facility and some of the recent applications, including photoresist contamination characterization, absorption spectroscopy of BF3 for neutron detection, low-flux calibration of photomultiplier tubes, calibration of space-based instrumentation, and our transfer standard photodiode program for dissemination of the U.S. national scale of detector responsivity in the EUV.Citation
262nd PTB Seminar: EUV Metrology
Pub Weblink
Pub Type
Websites
Keywords
SURF III, metrology, reflectometry, photoabsorption, calibration
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created November 27, 2011, Updated February 19, 2017