A SMALL-SAMPLE, BI-DIRECTIONAL SCATTERING MEASUREMENT SYSTEM FROM 200-500 GHz

Published

October 26, 2012

Author(s)

David R. Novotny, Josh Gordon, Edwin J. Heilweil, Brian C. Stillwell, Jeffrey R. Guerrieri, Erich N. Grossman, Shu Z. Lo

Abstract

Beginning the fall of 2012, NIST will be providing scattering measurements for other government agencies. We present performance results of a bi-directional scattering measurement system in the 200-500 GHz range. The goal is to provide dense-spectrum, bi-directional reflectance distribution function (BRDF) of sample materials and small objects that can be propagated into detection models and used as standard materials to compare performance of various detection and imaging systems. Our system is built upon a commercial frequency-domain, vector network analyzer system. The system is designed to minimize drift due to movement and temperature changes. The initial data, presented here, of reflectance from a variety of standard targets and sample materials show operation from 200-500 GHz and highlight stability, repeatability, and dynamic range of the system.

Proceedings Title

Proceedings of the 2012 Antenna Measurement Techniques Association Conference

Conference Dates

October 15-19, 2012

Conference Location

Seattle, CO, US

Pub Type

Conferences

Keywords

Terahertz, scattering, BRDF, imaging, RCS

Citation

Novotny, D. , Gordon, J. , Heilweil, E. , Stillwell, B. , Guerrieri, J. , Grossman, E. and Lo, S. (2012), A SMALL-SAMPLE, BI-DIRECTIONAL SCATTERING MEASUREMENT SYSTEM FROM 200-500 GHz, Proceedings of the 2012 Antenna Measurement Techniques Association Conference, Seattle, CO, US (Accessed October 8, 2025)