One-Step Traceability with NIST on a Chip: A Case for the Emergence of Quantum-Based Methods for Metrology and Sensing of Pressure, Vacuum, Temperature, Electric Fields, Mass, Force, and Torque, all enabled by the New SI

Published

May 8, 2023

Author(s)

Jay Hendricks, Barbara Goldstein, Alexandra Artusio-Glimpse, Christopher Holloway, Matthew Simons, Nikunjkumar Prajapati, Andrew Rotunno, Samuel Berweger, Kaleb Campbell, Maitreyi Jayaseelan, Nikolai Klimov, Zeeshan Ahmed, Daniel Barker, Stephen Eckel, James Fedchak, Jacob Ricker, Kevin Douglass, Tobias Herman, Michal Chojnacky, Julia Scherschligt, Stephan Schlamminger, Leon Chao, Zane Comden, John-Edward Draganov, Thinh Bui

Abstract

The world is changing. Measurements are everywhere. As sensors are embedded into everyday products and electronics, the importance of sensors that give "the right answer" or "none at all" is of growing importance. The traditional role of the national metrology institute (NMI) is also changing with the 2019 revision of the international system of units. This revision removed long-standing artifact-based standards in favor of fundamental constants of nature. Sensors that are built on fundamental physics, constants of nature, and in many cases quantum-based systems will open a new paradigm for metrology. NIST has developed the "NIST on a Chip" program with a far-reaching vision that the future of metrology will be based on a new suite of sensor technologies that effectively removes the need for calibration instruments or artifacts to be returned to the NMI for periodic recalibration. This will be due to the inherent stability of these sensors that ideally will be small, compact, take advantage of nanomanufacturing, nanophotonics, future development of on-chip lasers, frequency combs, pho-ton sources and detectors, etc. This paper will briefly discuss the promise for sensors and standards of pressure, vacuum, temperature, electric field, mass, force, and torque.

Proceedings Title

SMSI 2023 Conference Proceedings

Conference Dates

May 8-11, 2023

Conference Location

Nuremburg, DE

Conference Title

Sensor and Measurement Science International (SMSI) Conference 2023

Pub Type

Conferences

Download Paper

https://doi.org/10.5162/SMSI2023/C1.1

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Keywords

NIST on a Chip, NOAC, pressure, vacuum, cold atoms, fixed length optical cavity, Fabry Perot, quan-tum, nanophotonics, national metrology institute, temperature metrology, thermometry, photonics, Rydberg atoms, electrometry, revised SI, radio frequency, sensing, communications, Kibble balance, revised SI, force measurements, torque measurements

Citation

Hendricks, J. , Goldstein, B. , Artusio-Glimpse, A. , Holloway, C. , SIMONS, M. , Prajapati, N. , Rotunno, A. , Berweger, S. , Campbell, K. , Jayaseelan, M. , Klimov, N. , Ahmed, Z. , Barker, D. , Eckel, S. , Fedchak, J. , Ricker, J. , Douglass, K. , Herman, T. , Chojnacky, M. , Scherschligt, J. , Schlamminger, S. , Chao, L. , Comden, Z. , Draganov, J. and Bui, T. (2023), One-Step Traceability with NIST on a Chip: A Case for the Emergence of Quantum-Based Methods for Metrology and Sensing of Pressure, Vacuum, Temperature, Electric Fields, Mass, Force, and Torque, all enabled by the New SI, SMSI 2023 Conference Proceedings, Nuremburg, DE, [online], https://doi.org/10.5162/SMSI2023/C1.1, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936744 (Accessed September 25, 2026)

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