Mathur, N.
, Kim, Y.
, Kumar, R.
and Sutherland, J.
(2026),
A Semi-Markov Chain approach to temporally quantify critical materials across multiple product life cycles: Hard Disk Drives, CIRP Annals, Turin, IT, [online], https://doi.org/10.1016/j.cirp.2026.04.101, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=961402 (Accessed May 2, 2026)
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A Semi-Markov Chain approach to temporally quantify critical materials across multiple product life cycles: Hard Disk Drives
Published
Author(s)
, Yong Han Kim, Ritbik Kumar, JW Sutherland
Abstract
The development of suitable data infrastructure that identifies, tracks and quantifies potentially recoverable critical materials (CMs) secondary sources is necessary to plan for long-term CM supply security. The developed Semi-Markov Process (SMP) model temporally quantifies and characterizes individual material streams in Hard Disk Drives (HDDs). The model addresses gaps in current literature by taking a disaggregated approach to tracking individual materials in complex products subject to different end of use (EoU) pathways and integrates product lifecycle 'sojourn' times to compute retained material quantities. The SMP shows promise as a fundamental approach to developing reinforcement learning systems to optimize long-term objectives.Proceedings Title
CIRP Annals
Conference Dates
August 23-29, 2026
Conference Location
Turin, IT
Conference Title
CIRP General Assembly
Pub Type
Conferences
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Keywords
Manufacturing, Modelling, Semi-Markov approach
Citation
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Created April 30, 2026