This is a two-part CHIPS Metrology + SMART USA workshop series, focused on building meaningful connections between SMART USA members and CHIPS Metrology-funded research teams. The first event will be a virtual on June 17, 2025 that will set the foundation for the in-person workshop on June 24, 2025. The event aims to align research priorities with industry needs, showcase and refine CHIPS Metrology-funded research, and facilitate in-depth knowledge exchange through structured sessions. The workshop will also explore actionable opportunities for integrating SMART USA with METIS, CHIPS Metrology’s data exchange ecosystem, to accelerate innovation and competitiveness in the U.S. semiconductor industry.
Visitor Access Requirement:
*Use of apps, physical photocopies, and/or digital screenshots of your ID, Passport or Green card will not be accepted.