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Metrology for Digital Twins: Connecting CHIPS Metrology and SMART USA

This is a two-part CHIPS Metrology + SMART USA workshop series, focused on building meaningful connections between SMART USA members and CHIPS Metrology-funded research teams. The first event will be a virtual on June 17, 2025 that will set the foundation for the in-person workshop on June 24, 2025. The event aims to align research priorities with industry needs, showcase and refine CHIPS Metrology-funded research, and facilitate in-depth knowledge exchange through structured sessions. The workshop will also explore actionable opportunities for integrating SMART USA with METIS, CHIPS Metrology’s data exchange ecosystem, to accelerate innovation and competitiveness in the U.S. semiconductor industry.

Visitor Access Requirement:

  • For Non-US Citizens:  Please have your valid passport for photo identification.*
  • For US Permanent Residents: Please have your green card for photo identification.*
  • For US Citizens: Please have your state-issued driver's license. Regarding Real-ID requirements, all states are in compliance or have an extension through May 2025.*
    NIST also accepts other forms of federally issued identification in lieu of a state-issued driver's license, such as a valid passport, passport card, DOD's Common Access Card (CAC), Veterans ID, Federal Agency HSPD-12 IDs, and Military Dependents ID.

*Use of apps, physical photocopies, and/or digital screenshots of your ID, Passport or Green card will not be accepted.

Created May 23, 2025, Updated May 27, 2025
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