Statistical study and parallelization of multiplexed single-electron sources

Published

September 9, 2024

Author(s)

S Norimoto, P See, N Schoinas, I Rungger, Tommy Boykin, Michael Stewart, J. P. Griffiths, C. Chen, D. A. Ritchie, M. Kataoka

Abstract

Increasing electric current from a single-electron source is a main challenge in an effort to establish the standard of the ampere defined by the fixed value of the elementary charge e and operation frequency f . While the current scales with f , due to an operation frequency limit for maintaining accurate single-electron transfer, parallelisation of singleelectron sources is expected to be a more practical solution to increase the generated electric current I = Ne f , where N is a number of parallelised devices. One way to parallelise single-electron sources without increasing the complexity in device operation is to use a common gate. Such a scheme will require each device to have the same operation parameters for single-electron transfer. In order to investigate the probability that multiple devices share the same operation points, we study the statistics for operation gate voltages using single-electron sources embedded in a multiplexer circuit. The multiplexer circuit allows us to measure 64 single-electron sources individually in a single cooldown. We also demonstrate the parallelisation of three single-electron sources and observe the generated current enhanced by a factor of three.

Citation

Applied Physics Letters

Volume

125

Issue

11

Pub Type

Journals

Download Paper

https://doi.org/10.1063/5.0225998

Local Download

Keywords

quantum ampere, quantum dot

Citation

Norimoto, S. , See, P. , Schoinas, N. , Rungger, I. , Boykin, T. , Stewart, M. , Griffiths, J. , Chen, C. , Ritchie, D. and Kataoka, M. (2024), Statistical study and parallelization of multiplexed single-electron sources, Applied Physics Letters, [online], https://doi.org/10.1063/5.0225998, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=958097 (Accessed October 9, 2025)