Kopanski, J.
and Novotny, D.
(1989),
Development and characterization of insulating layers on silicon carbide::annual report for February 14, 1988 to February 14, 1989, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.89-4157 (Accessed May 2, 2026)
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Development and characterization of insulating layers on silicon carbide::annual report for February 14, 1988 to February 14, 1989
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- NIST IR 89-4157
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NIST IR 89-4157
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Created January 1, 1989, Updated May 20, 2023