Croarkin, M.
and Ehrstein, J.
(1999),
Standard Reference Materials ::The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements, 1999 edition/, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.260-131e2
(Accessed October 28, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Standard Reference Materials ::The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements, 1999 edition/
Published
Author(s)
,
Citation
- NIST SP 260-131e2
Report Number
NIST SP 260-131e2
Pub Type
NIST Pubs
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created January 1, 1999, Updated May 20, 2023