Berweger, S.
, Wallis, T.
and Kabos, P.
(2020),
Nanoelectronic Characterization using Microwave Near-Field Microscopy, IEEE Microwave Magazine, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=928045
(Accessed December 16, 2025)
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Nanoelectronic Characterization using Microwave Near-Field Microscopy
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Created September 4, 2020, Updated September 29, 2025