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Using 4D-STEM to Track Structural Changes Due to Electrochemical Doping in Organic Electrochemical Transistors

Published

Author(s)

Andrew Herzing, Lucas Flagg, Lee J. Richter
Citation
Microscopy and Microanalysis

Citation

Herzing, A. , Flagg, L. and Richter, L. (2022), Using 4D-STEM to Track Structural Changes Due to Electrochemical Doping in Organic Electrochemical Transistors, Microscopy and Microanalysis, [online], https://doi.org/10.1017/S1431927622008674, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=934375 (Accessed October 9, 2025)

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Created July 22, 2022, Updated November 29, 2022
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