NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Purnima Balakrishnan (Fed)

Publications

Lab-based multi-wavelength EUV diffractometry for critical dimension metrology

Author(s)
Bryan Barnes, Aaron Chew, Nicholas Jenkins, Yunzhe Shao, Martin Sohn, Regis Kline, Daniel Sunday, Purnima Balakrishnan, Thomas Germer, Steven Grantham, Clay Klein, Stephanie Moffitt, Eric Shirley, Henry Kapteyn, MARGARET MURNANE
Background: The industry is developing extreme-ultraviolet wavelength (EUV) techniques to measure critical dimensions (CDs) in logic fabrication. As nascent

Evidence of Antiferromagnetism in Ultrathin Metallic (111)-Oriented LaNiO3 Films

Author(s)
Margaret Kane, Purnima P. Balakrishnan, Okan Koksal, Megan Holtz, Andreas Suter, Michael R. Fitzsimmons, Chao-Yao Yang, Christoph Klewe, Paige Quarterman, Timothy R. Charlton, Andrew Herzing, Zaher Salman, Thomas Prokscha, Rossitza Pentcheva, Alexander Grutter, Yuri Suzuki
Antiferromagnets with exotic spin textures promise low-power spintronic devices with extremely high operating frequencies and resistance to external
View more Publications
Created December 8, 2019, Updated August 28, 2024
Was this page helpful?