NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Nail to Nail Fingerprint Challenge: Enrollment Set Size Variability

Published

Author(s)

Gregory P. Fiumara, Kenneth Ko, Elham Tabassi, Patricia A. Flanagan, John D. Grantham, Karen Marshall, Matthew Schwarz, Bryan Woodgate

Abstract

In September 2017, the Intelligence Advanced Research Projects Activity held a fingerprint data collection as part of the Nail to Nail Fingerprint Challenge. Thousands of latent fingerprint images collected at the Challenge were searched against rolled-equivalent fingerprints with an automated friction ridge identification system. These searches yielded poor results. It was hypothesized that the size of the enrollment set might be to blame for the weak performance. This supplemental report varied the size of the enrollment set to test the hypothesis.
Citation
NIST Interagency/Internal Report (NISTIR) - 8257
Report Number
8257
NIST Pub Series
NIST Interagency/Internal Report (NISTIR)
Pub Type
NIST Pubs

Download Paper

DOI Link

Keywords

acquisition, biometrics, capture devices, data, fingerprints, latent, prototypes, rolled, sensors
Biometrics

Citation

Fiumara, G. , Ko, K. , Tabassi, E. , Flanagan, P. , Grantham, J. , Marshall, K. , Schwarz, M. and Woodgate, B. (2019), Nail to Nail Fingerprint Challenge: Enrollment Set Size Variability, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.8257 (Accessed October 9, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created June 24, 2019, Updated September 13, 2019
Was this page helpful?