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Fan Fei (IntlAssoc)

Publications

Multi-scale alignment to buried atom-scale devices using Kelvin probe force microscopy

Author(s)
Pradeep Namboodiri, Jonathan Wyrick, Gheorghe Stan, Xiqiao Wang, Fan Fei, Ranjit Kashid, Scott Schmucker, Richard Kasica, Bryan Barnes, Michael Stewart, Richard M. Silver
Fabrication of quantum devices by atomic scale patterning with a Scanning Tunneling Microscope (STM) has led to the development of single/few atom transistors
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Created June 12, 2019, Updated December 8, 2022
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