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PUBLICATIONS

In-situ Elastic Strain Mapping via EBSD of Micro-Sized Specimens

Published

Author(s)

Mark McLean, William A. Osborn
Proceedings Title
Microscopy and Microanalysis 2017
Conference Dates
August 6-10, 2017
Conference Location
St Louis, MO
Pub Type
Conferences
Semiconductors and Nanometrology

Citation

McLean, M. and Osborn, W. (2017), In-situ Elastic Strain Mapping via EBSD of Micro-Sized Specimens, Microscopy and Microanalysis 2017, St Louis, MO (Accessed October 25, 2025)

Issues

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Created August 9, 2017, Updated July 2, 2018
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